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© 2021 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

Defect prediction is one of the key challenges in software development and programming language research for improving software quality and reliability. The problem in this area is to properly identify the defective source code with high accuracy. Developing a fault prediction model is a challenging problem, and many approaches have been proposed throughout history. The recent breakthrough in machine learning technologies, especially the development of deep learning techniques, has led to many problems being solved by these methods. Our survey focuses on the deep learning techniques for defect prediction. We analyse the recent works on the topic, study the methods for automatic learning of the semantic and structural features from the code, discuss the open problems and present the recent trends in the field.

Details

Title
A Survey on Software Defect Prediction Using Deep Learning
Author
Akimova, Elena N 1   VIAFID ORCID Logo  ; Alexander Yu Bersenev 1 ; Deikov, Artem A 1 ; Kobylkin, Konstantin S 1 ; Konygin, Anton V 2   VIAFID ORCID Logo  ; Mezentsev, Ilya P 1 ; Misilov, Vladimir E 1   VIAFID ORCID Logo 

 Krasovskii Institute of Mathematics and Mechanics, Ural Branch of RAS, S. Kovalevskaya Street 16, 620108 Ekaterinburg, Russia; [email protected] (A.Yu.B.); [email protected] (A.A.D.); [email protected] (K.S.K.); [email protected] (A.V.K.); [email protected] (I.P.M.); [email protected] (V.E.M.); Institute of Radioelectronics and Information Technology, Ural Federal University, Mira Street 19, 620002 Ekaterinburg, Russia 
 Krasovskii Institute of Mathematics and Mechanics, Ural Branch of RAS, S. Kovalevskaya Street 16, 620108 Ekaterinburg, Russia; [email protected] (A.Yu.B.); [email protected] (A.A.D.); [email protected] (K.S.K.); [email protected] (A.V.K.); [email protected] (I.P.M.); [email protected] (V.E.M.) 
First page
1180
Publication year
2021
Publication date
2021
Publisher
MDPI AG
e-ISSN
22277390
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2539939139
Copyright
© 2021 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.