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A Small Spot, Inert Gas, Ion Milling Process as a Complementary Technique to Focused Ion Beam Specimen Preparation
Fischione, Paul E; Williams, Robert E A; Genç, Arda; Fraser, Hamish L; Dunin-Borkowski, Rafal E
; et al.
Microscopy and Microanalysis; Oxford Vol. 23, Iss. 4, (Aug 2017): 782-793.
DOI:10.1017/S1431927617000514

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