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© 2021 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

An electrothermal piezoresistive cantilever (EPC) sensor is a low-cost MEMS resonance sensor that provides self-actuating and self-sensing capabilities. In the platform, which is of MEMS-cantilever shape, the EPC sensor offers several advantages in terms of physical, chemical, and biological sensing, e.g., high sensitivity, low cost, simple procedure, and quick response. However, a crosstalk effect is generated by the coupling of parasitic elements from the actuation part to the sensing part. This study presents a parasitic feedthrough subtraction (PFS) method to mitigate a crosstalk effect in an electrothermal piezoresistive cantilever (EPC) resonance sensor. The PFS method is employed to identify a resonance phase that is, furthermore, deployed to a phase-locked loop (PLL)-based system to track and lock the resonance frequency of the EPC sensor under cigarette smoke exposure. The performance of the EPC sensor is further evaluated and compared to an AFM-microcantilever sensor and a commercial particle counter (DC1100-PRO). The particle mass–concentration measurement result generated from cigarette-smoke puffs shows a good agreement between these three detectors.

Details

Title
Performance of an Electrothermal MEMS Cantilever Resonator with Fano-Resonance Annoyance under Cigarette Smoke Exposure
Author
Setiono, Andi 1   VIAFID ORCID Logo  ; Fahrbach, Michael 2   VIAFID ORCID Logo  ; Deutschinger, Alexander 3 ; Fantner, Ernest J 3 ; Schwalb, Christian H 4   VIAFID ORCID Logo  ; Iqbal Syamsu 5   VIAFID ORCID Logo  ; Wasisto, Hutomo Suryo 2   VIAFID ORCID Logo  ; Peiner, Erwin 2   VIAFID ORCID Logo 

 Institute of Semiconductor Technology (IHT), Laboratory of Emerging Nanometrology (LENA), Technische Universität Braunschweig, 38106 Braunschweig, Germany; [email protected] (M.F.); [email protected] (I.S.); [email protected] (H.S.W.); [email protected] (E.P.); Research Center for Physics, Indonesian Institute of Sciences (LIPI), Tangerang Selatan 15314, Indonesia 
 Institute of Semiconductor Technology (IHT), Laboratory of Emerging Nanometrology (LENA), Technische Universität Braunschweig, 38106 Braunschweig, Germany; [email protected] (M.F.); [email protected] (I.S.); [email protected] (H.S.W.); [email protected] (E.P.) 
 SCL-Sensor.Tech. Fabrication GmbH, 1220 Vienna, Austria; [email protected] (A.D.); [email protected] (E.J.F.) 
 GETec Microscopy GmbH, 1220 Vienna, Austria; [email protected] 
 Institute of Semiconductor Technology (IHT), Laboratory of Emerging Nanometrology (LENA), Technische Universität Braunschweig, 38106 Braunschweig, Germany; [email protected] (M.F.); [email protected] (I.S.); [email protected] (H.S.W.); [email protected] (E.P.); Research Center for Electronics and Telecommunication, Indonesian Institute of Sciences (LIPI), Jl. Sangkuriang-Komplek LIPI Gedung 20, Bandung 40135, Indonesia 
First page
4088
Publication year
2021
Publication date
2021
Publisher
MDPI AG
e-ISSN
14248220
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2545188493
Copyright
© 2021 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.