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Outliers in Statistical Data, 3rd ed. by Vic Barnett and Toby Lewis. John Wiley & Sons, New York, NY, 1994. xvii + 584 pp. $79.95. Reviewer: David M. Sebert, Intel Corporation, Chandler, AZ 85226.
THE vast amount of literature on outliers has been propagated by the well established fact that outliers can have a serious effect on conclusions drawn from a statistical analysis. Barnett and Lewis note that since the publication of the second edition of this book (1983) over a thousand new articles have appeared in refereed journals. As the authors state in the first edition of this book, their intent is to provide a comprehensive overview of the outlier problem which includes categorizing different schools of thought and reviewing strategies for outlier detection. This third edition is the authors' attempt to keep pace with the evolving state of knowledge...