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Engineering Single Defects in Silicon Carbide Bulk, Nanostructures and Devices
Lohrmann, Alexander; Johnson, B C; Almutairi, AFM; Lau, DWM; Negri, Marco
; et al.
Materials Science Forum; Pfaffikon Vol. 858, (May 2016): 312-317.
DOI:10.4028/www.scientific.net/MSF.858.312
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