- Preview Available
- Scholarly Journal
Atomic Force Microscopy (AFM) Analysis of an Object Larger and Sharper than the AFM Tip
Chen, Zhe; Luo, Jiawei; Doudevski, Ivo; Erten, Sema; Kim, Seong H.
Microscopy and Microanalysis; Oxford Vol. 25, Iss. 5, (Oct 2019): 1106-1111.
DOI:10.1017/S1431927619014697

This is a limited preview of the full PDF
Try and log in through your library or institution to see if they have access.