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Analysis of III-V Superlattice nBn Device Characteristics
Rhiger, David R; Smith, Edward P; Kolasa, Borys P; Kim, Jin K; Klem, John F
; et al.
Journal of Electronic Materials; Warrendale Vol. 45, Iss. 9, (Sep 2016): 4646-4653.
DOI:10.1007/s11664-016-4545-y
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