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© 2022 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

The structural characteristics of polymer track-etched membranes (TM) were obtained by atomic force microscopy (AFM) for a set of samples (polypropylene, polycarbonate, polyethylene terephthalate, with average pore diameters ~183, 375, and 1430 nm, respectively). The analysis of AFM experimental data was performed by using a specially developed technique for computer analysis of AFM images. The method allows one to obtain such parameters of TM as distribution of pore diameters, distribution of the minimum distances between the nearest pores, pore surface density, as well as to identify defective pores. Spatial inhomogeneities in the distribution of pore parameters were revealed. No anisotropy (some specific selected direction) was found in the surface distribution of the pores in the samples under study.

Details

Title
AFM Characterization of Track-Etched Membranes: Pores Parameters Distribution and Disorder Factor
Author
Golovanova, Alina V 1   VIAFID ORCID Logo  ; Domnina, Mariia A 2   VIAFID ORCID Logo  ; Arzhanov, Artem I 1   VIAFID ORCID Logo  ; Karimullin, Kamil R 1   VIAFID ORCID Logo  ; Ivan Yu Eremchev 1 ; Naumov, Andrey V 1   VIAFID ORCID Logo 

 Institute of Spectroscopy of the Russian Academy of Sciences, 108840 Moscow, Russia; [email protected] (M.A.D.); [email protected] (A.I.A.); [email protected] (K.R.K.); [email protected] (I.Y.E.); [email protected] (A.V.N.); Laboratory of Physics of Advanced Materials and Nanostructures, Moscow State Pedagogical University, 119435 Moscow, Russia; Lebedev Physical Institute of the Russian Academy of Sciences, Branch in Troitsk, 108840 Moscow, Russia 
 Institute of Spectroscopy of the Russian Academy of Sciences, 108840 Moscow, Russia; [email protected] (M.A.D.); [email protected] (A.I.A.); [email protected] (K.R.K.); [email protected] (I.Y.E.); [email protected] (A.V.N.); Laboratory of Physics of Advanced Materials and Nanostructures, Moscow State Pedagogical University, 119435 Moscow, Russia; Moscow Institute of Physics and Technology, 141700 Dolgoprudny, Russia 
First page
1334
Publication year
2022
Publication date
2022
Publisher
MDPI AG
e-ISSN
20763417
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2636123010
Copyright
© 2022 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.