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Accurate leakage current models for MOSFET nanoscale devices
Rjoub, Abdoul; Mistarihi, Mamoun; Nedal Al Taradeh.
International Journal of Electrical and Computer Engineering; Yogyakarta Vol. 10, Iss. 3, (Jun 2020): 2313-2321.
DOI:10.11591/ijece.v10i3.pp2313-2321
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