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- Dissertation or Thesis
Deep level defect studies in semi-insulating 4H- and 6H-silicon carbide using optical admittance spectroscopy
Deep level defect studies in semi-insulating 4H- and 6H-silicon carbide using optical admittance spectroscopyLee, Wonwoo.
The University of Alabama at Birmingham ProQuest Dissertations & Theses, 2006. 3226745.





