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Abstract
The insatiable desire for data fueled by the continuous development of new highly connected technologies leads to an input/output bottleneck and excessive energy consumption by the data centers. This tremendous electricity consumption results mainly heat generation, which represents a major issue for the environment and for the electronic devices themselves. Silicon (Si) integrated photonics, compatible with the CMOS processing technologies, has been proposed as a viable solution to extend the bandwidth and reduce power consumption. However, developing efficient and effective Si-based photonic devices is still one of the most arduous tasks to perform due to the indirect bandgap of both Si and germanium (Ge). Indeed, this property severely limits their emission and absorption rates, therefore making them inefficient. Group IV semiconductors alloys have been recently explored as possible materials to overcome this limitation. The Germanium-Tin (GeSn) alloys, for instance, may have a bandgap energy that is adjustable depending on the Sn composition and the lattice strain. They have been attracting a great deal of interest both from the theoretical standpoint for a better understanding of their physical properties and from the experimental side for designing and fabricating efficient devices. With this perspective, a theoretical framework is developed to investigate the luminescence properties of GeSn alloys. This framework relies on the band structure of these materials obtained within the eight-band k.p formalism and combined with the envelope function approximation (EFA) to estimate the absorption and spontaneous emission spectra of single bulk material. Unlike the joint density of states (JDOS) model, in which the momentum matrix element is considered constant, the oscillator strengths are explicitly computed in our model. They are also shown to be dependent on the wave vector k and the polarization of the incident electromagnetic field. Furthermore, a simple though accurate method is used to compute the integrals over the first Brillouin zone (BZ). This approach accounts explicitly for the impact of the lattice strain on the representative directions of the k-space. Next, using the framework mentioned above, the photoluminescence (PL) properties of both strained and relaxed GeSn were investigated. The differences between our approach and the JDOS model were highlighted at each step of the computations. Besides, the model was shown to fit the experimental data, and a value of ~ 1.6 ns was extracted at 4 K for the steady-state radiative carrier lifetime (τrad) of the as-grown Ge0.83Sn0.17 sample. This lifetime increases with the temperature while staying in the order of ns over the 4-80 K temperature range. Furthermore, the strain relaxation in the material was shown to increase τrad.





