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© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

This paper presents the results of uniaxial tensile tests on specimens of the hypoeutectic aluminum-silicon alloy A319. According to the results, the influence of surface treatment by pulsed electron beam on the mechanical properties of the material was determined. The peculiarities of deformation localization in the material caused by grinding of the surface layer material structure due to rapid crystallization during electron beam treatment were revealed. The surface treatment up to the depth of 100 µm leads to the formation of a fine dendritic columnar structure of silumin and to an increase in the plasticity of the samples. The influence of the surface treatment affects the increase in the deformation localization in the region of the stable concentrator before failure. The greatest increase in ductility and localization of deformation occurs during treatment with an energy density of 15 J/cm2. In the process of specimen deformation, unstable, metastable, and stable areas of plastic deformation localization are formed and replaced, and the formation of stable areas of localized plastic deformation, in which the specimen fails at the end of the test, can be detected at the initial stages of testing. In specimens, during the test in the zone of localized plastic deformation, bands are formed which pass through the entire surface of the specimen at an angle of 35 to 55 degrees to the tensile axis, and their development leads to the formation of stable zones of localized plastic deformation and to the failure of the specimen.

Details

Title
Deformation Inhomogeneities of a Hypoeutectic Aluminum-Silicon Alloy Modified by Electron Beam Treatment
Author
Ustinov, Artem 1   VIAFID ORCID Logo  ; Klopotov, Anatoly 1   VIAFID ORCID Logo  ; Ivanov, Yuri 2   VIAFID ORCID Logo  ; Zagulyaev, Dmitry 3   VIAFID ORCID Logo  ; Teresov, Anton 2   VIAFID ORCID Logo  ; Petrikova, Elizaveta 2   VIAFID ORCID Logo  ; Gurianov, Denis 4   VIAFID ORCID Logo  ; Chumaevskii, Andrey 4   VIAFID ORCID Logo 

 Faculty of Civil Engineering, Tomsk State University of Architecture and Building, Solyanaya Sq. 2, Tomsk 634003, Russia; [email protected] (A.U.); [email protected] (A.K.) 
 Institute of High Current Electronics SB RAS, Akademicheskij Ave. 2/3, Tomsk 634055, Russia; [email protected] (Y.I.); [email protected] (A.T.); [email protected] (E.P.) 
 Department of Natural Sciences Named after Professor V.M. Finkel, Siberian State Industrial University, Kirova Str. 42, Novokuznetsk 654007, Russia; [email protected] 
 Institute of Strength Physics and Materials Science, Siberian Branch of Russian Academy of Sciences, Akademicheskij Ave. 2/4, Tomsk 634055, Russia; [email protected] 
First page
2329
Publication year
2023
Publication date
2023
Publisher
MDPI AG
e-ISSN
19961944
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2791671649
Copyright
© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.