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© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

Magnetic shielding devices with a grid structure of multiple layers of highly magnetically permeable materials (such as permalloy) can achieve remanent magnetic fields at the nanotesla (nT) level or even lower. The remanence of the material inside the magnetic shield, such as the building materials used in the support structure, can cause serious damage to the internal remanence of the magnetic shield. Therefore, it is of great significance to detect the remanence of the materials used inside the magnetic shielding device. The existing test methods do not limit the test environment, the test process is vulnerable to additional magnetic field interference and did not consider the real results of the material in the weak magnetic environment. In this paper, a novel method of measuring the remanence of materials in a magnetic shielding cylinder is proposed, which prevents the interference of the earth’s magnetic field and reduces the measurement error. This method is used to test concrete components, composite materials and metal materials commonly applicated in magnetic shielding devices and determine the materials that can be used for magnetic shielding devices with 1 nT, 10 nT and 100 nT as residual magnetic field targets.

Details

Title
Testing and Analysis Method of Low Remanence Materials for Magnetic Shielding Device
Author
Cheng, Yuan 1 ; Luo, Yaozhi 2 ; Shen, Ruihong 1 ; Kong, Deyu 3   VIAFID ORCID Logo  ; Zhou, Weiyong 4   VIAFID ORCID Logo 

 College of Civil Engineering and Architecture, Zhejiang University, Hangzhou 310027, China; China United Engineering Co., Ltd., Hangzhou 310022, China 
 College of Civil Engineering and Architecture, Zhejiang University, Hangzhou 310027, China 
 College of Civil Engineering, Zhejiang University of Technology, Hangzhou 310023, China 
 School of Instrumentation Science and Optoelectronics Engineering, Beihang University, Beijing 100191, China 
First page
681
Publication year
2023
Publication date
2023
Publisher
MDPI AG
e-ISSN
19961944
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2767252803
Copyright
© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.