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© 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

Visual corona tests have been broadly applied for identifying the critical corona points of diverse high-voltage devices, although other approaches based on partial discharge or radio interference voltage measurements are also widely applied to detect corona activity. Nevertheless, these two techniques must be applied in screened laboratories, which are scarce and expensive, require sophisticated instrumentation, and typically do not allow location of the discharge points. This paper describes the detection of the visual corona and location of the critical corona points of a sphere-plane gap configurations under different pressure conditions ranging from 100 to 20 kPa, covering the pressures typically found in aeronautic environments. The corona detection is made with a low-cost CMOS imaging sensor from both the visible and ultraviolet (UV) spectrum, which allows detection of the discharge points and their locations, thus significantly reducing the complexity and costs of the instrumentation required while preserving the sensitivity and accuracy of the measurements. The approach proposed in this paper can be applied in aerospace applications to prevent the arc tracking phenomenon, which can lead to catastrophic consequences since there is not a clear protection solution, due to the low levels of leakage current involved in the pre-arc phenomenon.

Details

Title
Experimental Study of Visual Corona under Aeronautic Pressure Conditions Using Low-Cost Imaging Sensors
Author
Jordi-Roger Riba 1   VIAFID ORCID Logo  ; Gómez-Pau, Álvaro 2   VIAFID ORCID Logo  ; Moreno-Eguilaz, Manuel 2   VIAFID ORCID Logo 

 Electrical Engineering Department, Universitat Politècnica de Catalunya, 08222 Terrassa, Spain 
 Electronics Engineering Department, Universitat Politècnica de Catalunya, 08222 Terrassa, Spain; [email protected] (Á.G.-P.); [email protected] (M.M.-E.) 
First page
411
Publication year
2020
Publication date
2020
Publisher
MDPI AG
e-ISSN
14248220
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2550297416
Copyright
© 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.